A short summary of the drift-diffusion-Langevin formalism for calculatingfinite-frequency shot noise in diffusive conductors is presented. Two newresults are included in this presentation. First, we arrive at a simple (butaccurate) phenomenological expression for the semiclassical distributionfunction of electrons in the presence of electron-electron scattering. Second,it is shown that in thin samples, low-frequency shot noise may be large even ifthe sample length is much larger than the electron-phonon relaxation length.
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